首页> 外国专利> IN-SITU IDENTIFICATION AND CONTROL OF MICROSTRUCTURES PRODUCED BY PHASE TRANSFORMATION OF A MATERIAL

IN-SITU IDENTIFICATION AND CONTROL OF MICROSTRUCTURES PRODUCED BY PHASE TRANSFORMATION OF A MATERIAL

机译:材料相变产生的微结构的原位识别和控制

摘要

A microstructure detector and in-situ method for real-time determination of the microstructure of a material undergoing alloying or other phase transformation. The method carried out by the detector includes the steps of: (a) detecting light emitted from a plasma plume created during phase transformation of a material; (b) determining at least some of the spectral content of the detected light; and (c) determining an expected microstructure of the transformed material from the determined spectral content. Closed loop control of the phase transformation process can be carried out using feedback from the detector to achieve a desired microstructure.
机译:一种用于实时确定正在合金化或其他相变的材料的微观结构的微观结构检测器和原位方法。检测器执行的方法包括以下步骤:(a)检测从材料相变过程中产生的等离子羽流发出的光; (b)确定所检测到的光的至少某些光谱含量; (c)根据所确定的光谱含量确定所预期的转化材料的微观结构。可以使用来自检测器的反馈来执行相变过程的闭环控制,以实现所需的微结构。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号