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Pre-screening method, manufacturing method, device and electronic apparatus of micro-LED

机译：micro-led的预筛选方法，制造方法，装置及电子设备

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摘要

A pre-screening method, manufacturing method, device and electronic apparatus of micro-LED. The method for pre-screening defect micro-LEDs comprises: obtaining a defect pattern of defect micro-LEDs on a laser-transparent substrate (S6100); and irradiating the laser-transparent substrate with laser from the laser-transparent substrate side in accordance with the defect pattern (S6200), to lift-off the defect micro-LEDs from the laser-transparent substrate.

机译：微型LED的预筛选方法，制造方法，装置和电子设备。一种缺陷微LED的预筛方法，包括：在激光透明基板（S 6100 ）上获得缺陷微LED的缺陷图案;然后，根据缺陷图案（S 6200 ），从激光透明基板一侧对激光透明基板照射激光，以从激光透明基板上剥离缺陷微型LED。 展开▼

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公开/公告号US10177016B2

专利类型

公开/公告日2019-01-08

原文格式PDF

申请/专利权人 GOERTEK.INC;
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申请/专利号US201515529590

发明设计人 QUANBO ZOU;ZHE WANG;
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申请日2015-08-18

分类号H01L33;H01L33/62;H01L33/40;H01L21/67;H01L23;H01L27/15;

国家 US

入库时间 2022-08-21 12:04:17

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