MALFUNCTION DETECTION APPARATUS CAPABLE OF DETECTING ACTUAL MALFUNCTIONING DEVICE NOT DUE TO ABNORMAL INPUT VALUES

摘要

A first classification circuit obtains first measured values from each of devices, the first measured values of the device including at least one input value to the device and at least one output value from the device, and classifies the first measured values of the devices into normal first measured values and outlier first measured values using the OCSVM (One Class nu-Support Vector Machine). A second classification circuit obtains second measured values from each of devices, the second measured values of the device including at least one input value to the device, and classifies the second measured values of the devices into normal second measured values and outlier second measured values using the OCSVM. A determination circuit determines a device having the outlier first measured values and the normal second measured values, to be a malfunctioning device.