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INVERSE-IMAGE SAMPLING DEVICE, INVERSE-IMAGE SAMPLING METHOD, AND INVERSE-IMAGE SAMPLING PROGRAM

机译:逆图像采样装置,逆图像采样方法以及逆图像采样程序

摘要

An inverse-image sampling device 10 includes: a grouping means 11 that extracts basis vectors from a set of basis vectors for a lattice having a predetermined relationship with a matrix used to generate a public key, and that groups the basis vectors such that a predetermined condition is satisfied; and a sampling means 12 that samples, for at least one group, the same number of arbitrary values as the number of a plurality of basis vectors included in that group, in parallel for the individual basis vectors, onto a lattice constituted by the plurality of basis vectors, the arbitrary values serving as random numbers following a discrete Gaussian distribution. The predetermined condition is that each of the basis vectors included in a group is orthogonal to the other basis vectors included in the same group and is also orthogonal to Gram-Schmidt basis vectors, which are vectors obtained by orthogonalizing the other basis vectors by Gram-Schmidt orthogonalization.
机译:逆图像采样装置10包括:分组装置11,该分组装置11从与用于生成公钥的矩阵具有预定关系的格子的一组基本矢量中提取基本矢量,并且将所述基本矢量分组为预定的条件得到满足;采样装置12,对于至少一组,将与该组中包含的多个基本矢量的数量相同数量的任意值,与各个基本矢量并行地采样到由多个基本矢量构成的格子上基本向量,任意值充当离散高斯分布之后的随机数。预定条件是,组中包括的每个基本矢量与同一组中包括的其他基本矢量正交,并且还与Gram-Schmidt基本矢量正交,Gram-Schmidt基本矢量是通过用Gram-施密特正交化。

著录项

  • 公开/公告号WO2018207348A1

    专利类型

  • 公开/公告日2018-11-15

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号WO2017JP18030

  • 发明设计人 TANAKA YUKI;MINEMATSU KAZUHIKO;

    申请日2017-05-12

  • 分类号G09C1;H04L9/30;H04L9/32;

  • 国家 WO

  • 入库时间 2022-08-21 11:58:11

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