首页> 外国专利> DIFFRACTION GRATING FOR X-RAY PHASE CONTRAST AND/OR DARK-FIELD IMAGING

DIFFRACTION GRATING FOR X-RAY PHASE CONTRAST AND/OR DARK-FIELD IMAGING

机译:X射线相衬和/或暗场成像的衍射光栅

摘要

The present invention relates to a grating for X-ray phase contrast and/or dark-field imaging. It is described to form a photo-resist layer on a surface of a substrate. The photo-resist layer is illuminated with radiation using a mask representing a desired grating structure. The photo-resist layer is etched to remove parts of the photo-resist layer, to leave a plurality of trenches that are laterally spaced from one across the surface of the substrate. A plurality of material layers are formed on the surface of the substrate. Each layer is formed in a trench. A material layer comprises a plurality of materials, wherein the plurality of materials are formed one on top of the other in a direction perpendicular to the surface of the substrate. The plurality of materials comprises at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold and the plurality of materials comprises Gold.
机译:本发明涉及一种用于X射线相位对比和/或暗场成像的光栅。描述了在基板的表面上形成光致抗蚀剂层。使用代表所需光栅结构的掩模用辐射照射光致抗蚀剂层。蚀刻光致抗蚀剂层以去除光致抗蚀剂层的一部分,从而留下多个沟槽,这些沟槽在整个基板表面上与一个横向间隔开。在基板的表面上形成多个材料层。每层形成在沟槽中。材料层包括多种材料,其中所述多种材料在垂直于所述基板的表面的方向上在彼此之上形成。多种材料包括具有比金的k-边缘吸收能高的k-边缘吸收能的至少一种材料,并且多种材料包括金。

著录项

  • 公开/公告号WO2019048252A1

    专利类型

  • 公开/公告日2019-03-14

    原文格式PDF

  • 申请/专利权人 KONINKLIJKE PHILIPS N.V.;

    申请/专利号WO2018EP72833

  • 发明设计人 KOEHLER THOMAS;

    申请日2018-08-24

  • 分类号G01N23/20;A61B6;G01J3/18;G01N23/04;G01N23/20008;

  • 国家 WO

  • 入库时间 2022-08-21 11:56:01

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