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PCB EMBEDDED STACK FOR IMPROVED ELECTRICAL FUNCTIONALITY AND TEST

机译:PCB嵌入式堆栈,可改善电气功能和测试

摘要

Embodiments include device packages and methods of forming the device packages. A device package may have a plurality of dies that are stacked. Each die may have one or more die contacts that are each electrically coupled to at least one die contact of another die with interconnects. For one embodiment, a substrate is disposed adjacent to the dies and has a first set and second set of pads. An encapsulation layer may be deposited over and around the dies, the interconnects, and the substrate. For one embodiment, the second set of pads on the bottom surface of the substrate are exposed. Additionally, the device package may include at least one interconnect having a first and second end, where the first end is connected to one die contact and the second end extends through the encapsulation layer to at least one pad of the first set of pads.
机译:实施例包括器件封装和形成器件封装的方法。器件封装可以具有堆叠的多个管芯。每个管芯可以具有一个或多个管芯触点,每个管芯触点通过互连电耦合到另一管芯的至少一个管芯触点。对于一个实施例,衬底被设置成邻近管芯并且具有第一组和第二组焊盘。可以在管芯,互连件和衬底上方和周围沉积封装层。对于一个实施例,暴露在衬底的底表面上的第二组焊盘。另外,器件封装可以包括具有第一端和第二端的至少一个互连,其中第一端连接到一个管芯接触,并且第二端延伸穿过封装层到达第一组焊盘中的至少一个焊盘。

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