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TWO-DIMENSIONAL SPECTROSCOPIC MEASUREMENT METHOD AND TWO-DIMENSIONAL SPECTROSCOPIC MEASUREMENT DEVICE

机译:二维光谱测量方法和二维光谱测量装置

摘要

In this two-dimensional spectroscopic measurement method, a first optical frequency comb in which a repetition frequency is four times an offset frequency is generated, the first optical frequency comb is divided into second to fifth optical frequency combs, and the phases of the fourth optical frequency comb and the fifth optical frequency comb on a time axis are offset from each other by 90°. In the two-dimensional spectroscopic measurement method, the envelope strength of the following is acquired: an interference signal of the third and fourth optical frequency combs in which either of said optical frequency combs includes optical information regarding a sample; and an interference signal of the third and fifth optical frequency combs in which either of said optical frequency combs includes optical information regarding a sample. The optical information regarding the sample is then extracted on the basis of the envelope strength.
机译:在该二维光谱测量方法中,生成重复频率是偏移频率的四倍的第一光学频率梳,将第一光学频率梳分为第二至第五光学频率梳,以及第四光学相位。频率梳和时间轴上的第五光学频率梳彼此偏移90°。在二维光谱测量方法中,获得以下的包络强度:第三和第四光学频率梳的干涉信号,其中所述光学频率梳中的任何一个包括关于样本的光学信息;第三和第五光学频率梳的干扰信号,其中所述光学频率梳中的任何一个都包括关于样本的光学信息。然后根据包络强度提取有关样品的光学信息。

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