首页> 外国专利> Two-dimensional flicker measurement device, two-dimensional flicker measurement system, two-dimensional flicker measurement method and two-dimensional flicker measurement program

Two-dimensional flicker measurement device, two-dimensional flicker measurement system, two-dimensional flicker measurement method and two-dimensional flicker measurement program

机译:二维闪烁测量装置,二维闪烁测量系统,二维闪烁测量方法和二维闪烁测量程序

摘要

The two-dimensional flicker measuring apparatus includes a two-dimensional imaging element having a partial reading function for reading a portion of the imaging region, a setting unit configured to set a plurality of portions corresponding to a partial region including two or more measurement regions in the imaging region, and a set portion A control unit for acquiring a photometric amount of a plurality of partial regions corresponding to each of a plurality of portions by imaging the object to be measured multiple times by using the partial reading function on the two-dimensional imaging element with the number of times as the number of imaging, and the acquired A calculation unit that performs processing for calculating the flicker amount of two or more measurement regions included in the partial region based on the photometric amount of the partial region is provided for each of the plurality of partial regions.
机译:二维闪烁测量设备包括:具有用于读取成像区域的一部分的部分读取功能的二维成像元件;设置单元,其被配置为:在其中设置与包括两个或更多个测量区域的部分区域相对应的多个部分。设定区域A控制单元,其通过使用二维上的局部读取功能多次对要测量的对象进行成像来获取与多个部分中的每个部分相对应的多个部分区域的测光量。提供具有次数作为成像次数的成像元件,以及获取的A计算单元,该计算单元执行用于基于部分区域的测光量来计算部分区域中包括的两个或更多个测量区域的闪烁量的处理。多个局部区域中的每一个。

著录项

  • 公开/公告号KR20200044926A

    专利类型

  • 公开/公告日2020-04-29

    原文格式PDF

  • 申请/专利权人 코니카 미놀타 가부시키가이샤;

    申请/专利号KR20207009088

  • 发明设计人 마스다 사토시;

    申请日2018-09-10

  • 分类号G01J1/42;G01J1/44;G01M11;H04N5/235;

  • 国家 KR

  • 入库时间 2022-08-21 11:07:16

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号