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SPECTROSCOPIC CHARACTERISTIC MEASUREMENT DEVICE, SPECTROSCOPIC CHARACTERISTIC MEASUREMENT METHOD, AND FURNACE CONTROL METHOD

机译:光谱特征测量装置,光谱特征测量方法和炉控制方法

摘要

A spectroscopic characteristic measurement device 1 according to an embodiment of the present invention comprises: an imaging spectroscopic device 4 that acquires light emitted from a linear region of an object A or reflected light from the linear region as spectral information; a two-dimensional imaging device 6 that captures an image of a two-dimensional region containing the linear area on the object A; and an arithmetic device 7 that determines, on the basis of the image captured by the two-dimensional imaging device 6, the range in which the imaging spectroscopic device 4 acquires the spectral information.
机译:根据本发明实施例的光谱特性测量设备1包括:成像光谱设备4,其获取从对象A的线性区域发射的光或从线性区域反射的光作为光谱信息;以及二维成像装置6,其捕获包含对象A上的线性区域的二维区域的图像;运算装置7根据由二维摄像装置6拍摄到的图像来确定摄像光谱装置4获取光谱信息的范围。

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