首页> 外国专利> METHOD AND DEVICE FOR CHARACTERISING AN ELECTROMAGNETIC FIELD, AND NON-DESTRUCTIVE INSPECTION METHOD AND DEVICE BY USING AN ELECTROMAGNETIC FIELD

METHOD AND DEVICE FOR CHARACTERISING AN ELECTROMAGNETIC FIELD, AND NON-DESTRUCTIVE INSPECTION METHOD AND DEVICE BY USING AN ELECTROMAGNETIC FIELD

机译:表征电磁场的方法和装置,以及使用电磁场的非破坏性检查方法和装置

摘要

Characterisation method for characterising an electromagnetic field, comprising a transformation step in which the electromagnetic field (7) to be characterised is passed through a reference material (5) the optical properties of which change under the action of an electromagnetic field, wherein an incident light strikes the reference material (5), giving rise to a resulting light. The characterisation method further comprises a detection step in which an image representative of the electromagnetic field (7) to be characterised is obtained from the resulting light. The invention also relates to a characterisation device associated with the characterisation method, and to a non-destructive inspection method and device.
机译:用于表征电磁场的表征方法,包括变换步骤,其中待表征的电磁场(7)穿过参考材料(5),该参考材料的光学特性在电磁场的作用下发生变化,其中入射光撞击参考材料(5),从而产生光。表征方法还包括检测步骤,在该步骤中,从所得的光获得表示待表征的电磁场(7)的图像。本发明还涉及与表征方法相关联的表征装置,以及无损检查方法和装置。

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