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An analyzer for electromagnetic fields of devices in which the electromagnetic field close to a conductor is, and electrical charge is moved in the electromagnetic field and method for the analysis of the electromagnetic field.
An analyzer for electromagnetic fields of devices in which the electromagnetic field close to a conductor is, and electrical charge is moved in the electromagnetic field and method for the analysis of the electromagnetic field.
PURPOSE:To analyze the distribution of an electromagnetic field by arranging a register equivalent to a load resistance applied to the electromagnetic field on an analysis area, and converting a voltage and a current applied to the resistor into the electric field and magnetic field components. CONSTITUTION:Data setting an initial condition and a boundary condition is inputted from an input means 1, and a charge motion analyzing means 2 analyzes the position and speed of an electric charge at a prescribed time, and a magnetic field analyzing means 3 finds the distribution of the magnetic field, and a resistance model equivalent to the load resistance applied to the electromagnetic field is arranged, and the strength of the magnetic field at the above model is found, and an equivalent current analyzing means 4 finds the current that flows on the resistor by the boundary condition of a conductor surface magnetic field. A voltage drop analyzing means 5 finds the amount of voltage drop at both terminals of an equivalent load resistor, and an electric field strength analyzing means 6 analyzes the strength of the electric field at the position of the load resistor, and an electric field analyzing means 7 finds the electric field, and a control means 8 repeats such driving corresponding to the lapse of time. Therefore, it is possible to analyze the distribution of the electromagnetic field and that of the electric charge in the inside from time to time quantitatively.
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