LINEAR-SCAN ULTRASONIC INSPECTION APPARATUS AND LINEAR-SCAN ULTRASONIC INSPECTION METHOD

摘要

A linear scan ultrasonic inspection apparatus according to an embodiment includes an ultrasonic array probe having ultrasonic elements arranged in a first direction; a delay time calculation unit configured to calculate a value of a delay time of at least one of transmitting and receiving ultrasonic waves with reference to the surface shape of the object to be inspected; an overlap area adjustment unit configured to set a condition for generating an image of the overlap area; and an integrated image generation unit configured to generate first image data of a range including the overlap area. The overlap area adjustment unit is configured to set the condition of the surface shape that the delay time calculation unit refers to during calculation of the value of the delay time in one of first and second probe installation positions as both of the first acquisition shape obtained at the first probe installation position and the second acquisition shape obtained at the second probe installation position.