A glass substrate distortion measuring method and an apparatus for measuring a glass substrate distortion capable of easily placing (placing and placing) a glass substrate and capable of measuring the degree of distortion of the glass substrate easily and quickly. A distortion measuring method for measuring a distortion of an arbitrary position of a glass substrate (G) on a mount (20), characterized in that the glass substrate (G) The mounting table 30 is tilted so that the mounting table 30 is turned to a horizontal state and the table 30 in the horizontal state is placed on the measurement area M on the table 20, And the glass substrate G is irradiated with laser light through the opening 31b of the mounting table 30 in the measurement area M to measure the distortion.
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