首页> 外国专利> INDIVIDUAL BEAM DETECTOR FOR MULTIPLE BEAMS MULTI-BEAM IRRADIATION APPARATUS AND INDIVIDUAL BEAM DETECTION METHOD FOR MULTIPLE BEAMS

INDIVIDUAL BEAM DETECTOR FOR MULTIPLE BEAMS MULTI-BEAM IRRADIATION APPARATUS AND INDIVIDUAL BEAM DETECTION METHOD FOR MULTIPLE BEAMS

机译:用于多光束的单光束检测器多光束辐照装置和用于多光束的单光束检测方法

摘要

An objective of the present invention is to provide an individual beam detector for multiple beams, which is capable of preventing clogging of a fine hole caused by impurities in a short period of time, an apparatus having the individual beam detector mounted thereon, and an individual beam detection method for multiple beams. According to an aspect of the present invention, the individual beam detector for multiple beams includes: a thin film having a film thickness which enables transmittance of the multiple beams, and having a through hole formed therein, which has a size smaller than a pitch between the beams of multiple beams and larger than the diameter of the beams; a support not only supporting the thin film, but also having an opening formed therein under a region including the through hole in the thin film, and formed with a width size of the opening for a circumferential temperature of the through hole in the thin film to become a temperature higher than an evaporation temperature of impurities attached to the circumference of the through hole when the multiple beams are irradiated onto the thin film; and a sensor disposed at a distance from the thin film to obtain a detection value having a contrast distinguishable from a detection object beam passing through the through hole of the thin film.
机译:发明内容本发明的目的在于提供一种能够在短时间内防止由杂质引起的细孔的堵塞的多条光束的单光束检测器,安装有该单光束检测器的装置以及单光束检测器。多光束的光束检测方法。根据本发明的一个方面,用于多光束的单独光束检测器包括:薄膜,该薄膜具有使得多光束能够透射的膜厚度,并且其中形成有通孔,该通孔的尺寸小于彼此之间的间距。多光束的光束,其直径大于光束的直径;支撑体不仅支撑薄膜,还具有开口,该开口形成在包括薄膜中的通孔的区域下方,并且形成有开口的宽度尺寸,以用于薄膜中通孔的周向温度。当多束光束照射到薄膜上时,温度变得高于附着在通孔周围的杂质的蒸发温度;传感器设置在距薄膜一定距离处,以获得具有与穿过薄膜的通孔的检测对象光束不同的对比度的检测值。

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