METHOD OF ANALYZING SILICON REDUCER USING FOURIER TRANSFORM INFRARED SPECTROSCOPY

摘要

The present invention relates to a method for analyzing a silicon reducing agent using an infrared spectrometer. According to one aspect of the present invention, provided is the method for analyzing the silicon reducing agent using the infrared spectrometer comprising: a step of preparing a sample of a silicon reducing agent; a step of measuring an infrared spectral spectrum of the sample; a step of deriving a measured value by integrating an area of 1100 cm^(-1) to 1020 cm^(-1) in the spectral spectrum; and a step of calculating a concentration value of silicon oxide using a calibration curve for the measured value and the standard sample.