首页> 外国专利> - METHOD MEASURING THICKNESS AND REFRACTIVE INDEX OF PLANAR SAMPLES BASED ON FABRY-PEROT INTERFEROMETER

- METHOD MEASURING THICKNESS AND REFRACTIVE INDEX OF PLANAR SAMPLES BASED ON FABRY-PEROT INTERFEROMETER

机译:-法布里-珀罗干涉仪测量平面样品厚度和折射率的方法

摘要

The present invention relates to a method for measuring the thickness and refractive index of a flat panel based on a Fabry-Perot interferometer, which is able to measure the thickness and refractive index of a flat panel sample with transparency and a phase refractive index value in accordance with a wavelength, send a beam from a light source emitting a light with a broad wavelength through an optical fiber, connect a green lens to an optical fiber on an output end on the opposite side of an optical fiber coupler connected to the optical fiber, make the beam outputted from the optical fiber a parallel light and transmit the beam, place a transparent window and a mirror, which are parallel to an output cross-section of the green lens, make a Fabry-Perot interferometer, form an interference pattern, allow the beam reflected from the mirror to pass through the green lens and the optical fiber coupler and to be outputted to another optical fiber path on the side of an input end of the optical fiber coupler, connect an end of the optical fiber output end to an optical spectrum analyzer, analyze an optical spectrum, insert the flat panel sample into a part between the transparent window and the mirror to be vertical to the beam path, measure the outputted interference pattern spectrum by the optical spectrum analyzer, perform a Fourier transform of the interference pattern spectrums of the two cases, obtain a frequency distribution, obtain a thickness and a group refractive index of the sample from the frequency relationship coming under the interference pattern between the surfaces, perform a Fourier filtering only on the frequency coming under the interference pattern by both surfaces of the flat panel sample, extract only the interference pattern spectrum by both surfaces of the flat panel, and simply and precisely obtain a phase refractive index of the flat panel sample in accordance with a wavelength based on the Fabry-Perot interference theory formula by a non-contact method.
机译:本发明涉及一种基于法布里-珀罗(Fabry-Perot)干涉仪的平板的厚度和折射率的测量方法,该方法能够以透明和相位折射率值测量平板样品的厚度和折射率。根据波长,将来自发出宽波长光的光源的光束通过光纤发送,在连接到光纤的光纤耦合器另一侧的输出端将绿色透镜连接到光纤,使从光纤输出的光束成为平行光并透射光束,放置与绿色透镜的输出截面平行的透明窗口和反射镜,制成法布里-珀罗干涉仪,形成干涉图样,使从反射镜反射的光束穿过绿色透镜和光纤耦合器,并输出到op的输入端一侧的另一条光纤路径立式光纤耦合器,将光纤输出端的一端连接到光谱分析仪,分析光谱,将平板样品插入透明窗口和反射镜之间的垂直于光路的部分,测量输出通过光谱分析仪进行干涉图谱光谱分析,对两种情况的干涉图谱光谱进行傅立叶变换,获得频率分布,并根据位于干涉图谱之间的干涉图谱下的频率关系获得样品的厚度和群折射率。表面,仅对平板样品的两个表面都在干涉图样之下的频率进行傅立叶滤波,仅提取平板两个表面的干涉图谱,并简单而精确地获得平板的相位折射率根据非Faber-Perot干涉理论公式根据波长确定面板样本圆滑的方法。

著录项

  • 公开/公告号KR20190091144A

    专利类型

  • 公开/公告日2019-08-05

    原文格式PDF

  • 申请/专利号KR20180010227

  • 发明设计人 KIM KYONG HON;

    申请日2018-01-26

  • 分类号G01N21/45;G01B11/06;G01B9/02;G01D21/02;G01J3/02;G01N21/41;G06F17/14;

  • 国家 KR

  • 入库时间 2022-08-21 11:50:14

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