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X- X- X-RAY DETECTION OPTICS FOR SMALL-ANGLE X-RAY SCATTEROMETRY

机译:小角度X射线比色法的X- X-射线检测光学器件

摘要

An X-ray device comprises a mount, an X-ray emission source, a detector, an actuator, and a controller. The mount is configured to retain a sample. The X-ray emission source is configured to direct an X-ray beam towards a first side of the sample. The detector is positioned on a second side of the sample opposite to the first side to accommodate at least a portion of an X-ray transmitted through the sample and output a signal indicating an intensity of the accommodated X-ray. The actuator is configured to scan the detector over a range of positions on the second side of the sample to measure the transmitted X-ray by a scattering angle function. The controller is coupled to receive a signal outputted by the detector and control the actuator in response to the signal to increase an acquisition time of the detector at a first position where the intensity of the accommodated X-ray is weak with respect to an acquisition time of the detector at a second position where the intensity of the accommodated X-ray is strong.
机译:X射线设备包括底座,X射线发射源,检测器,致动器和控制器。支架配置为保留样品。 X射线发射源被配置成将X射线束朝着样品的第一侧引导。检测器位于样品的与第一侧相对的第二侧上,以容纳透射过样品的X射线的至少一部分,并输出指示所容纳的X射线的强度的信号。致动器被配置为在样本的第二侧上的位置范围上扫描检测器,以通过散射角函数来测量透射的X射线。控制器被耦合以接收由检测器输出的信号,并且响应于该信号来控制致动器,以增加在第一位置的检测器的获取时间,在该第一位置处所容纳的X射线的强度相对于获取时间较弱。在所容纳的X射线的强度较强的第二位置处的探测器的角度。

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