首页> 外国专利> SYSTEM AND METHOD FOR USING A RATE OF DECAY MEASUREMENT FOR REAL TIME MEASUREMENT AND CORRECTION OF ZERO OFFSET AND ZERO DRIFT OF A MASS FLOW CONTROLLER OR MASS FLOW METER

SYSTEM AND METHOD FOR USING A RATE OF DECAY MEASUREMENT FOR REAL TIME MEASUREMENT AND CORRECTION OF ZERO OFFSET AND ZERO DRIFT OF A MASS FLOW CONTROLLER OR MASS FLOW METER

机译:使用衰减率进行实时测量和校正质量流量控制器或质量流量计的零位偏移和零位漂移的系统和方法

摘要

The disclosed embodiments include a method, apparatus, and computer program product for providing a self-verifying mass flow controller or mass flow meter. For example, in one embodiment, a magnetically versatile mass flow controller is disclosed that does not require any software modifications to the tool / tool control in which the mass flow controller is used. In another embodiment, a self-verifying mass flow controller is disclosed that does not require any hardware or mechanical modifications to existing mass flow controllers. The disclosed embodiments further include a magnetically-assisted mass flow controller that simultaneously performs valve-leakage values and sensor offsets in the presence of valve leakage to perform real-time field calibration of the mass flow controller output to zero offset or zero drift.
机译:公开的实施例包括用于提供自验证质量流量控制器或质量流量计的方法,设备和计算机程序产品。例如,在一个实施例中,公开了一种磁性通用的质量流量控制器,其不需要对使用质量流量控制器的工具/工具控件进行任何软件修改。在另一个实施例中,公开了一种自验证质量流量控制器,其不需要对现有质量流量控制器进行任何硬件或机械修改。所公开的实施例还包括磁辅助质量流量控制器,其在存在阀泄漏的情况下同时执行阀泄漏值和传感器偏移,以执行质量流量控制器输出至零偏移或零漂移的实时现场校准。

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