首页> 外国专利> --INTEGRATED CIRCUIT INCLUDING CLOCK CONTROL CIRCUIT FOR DEBUGGING CIRCUIT AND SYSTEM-ON-CHIP INCLUDING THE SAME

--INTEGRATED CIRCUIT INCLUDING CLOCK CONTROL CIRCUIT FOR DEBUGGING CIRCUIT AND SYSTEM-ON-CHIP INCLUDING THE SAME

机译:-集成电路,包括时钟控制电路,用于调试电路和包括该电路的芯片上系统

摘要

The integrated circuit includes a processor core, a clock control circuit, and a debugging circuit. The processor core processes a plurality of instructions and data constituting the target software. The clock control circuit determines an electrical connection state between the processor core and an external debugger that performs a debugging operation on the target software, generates an output clock signal selectively activated based on the determination result and the input clock signal do. The debugging circuit provides information to the external debugger related to the debugging operation for the target software based on the output clock signal.
机译:该集成电路包括处理器核,时钟控制电路和调试电路。处理器核心处理构成目标软件的多个指令和数据。时钟控制电路确定处理器内核与在目标软件上执行调试操作的外部调试器之间的电连接状态,并基于确定结果和输入时钟信号do产生选择性激活的输出时钟信号。调试电路基于输出时钟信号向外部调试器提供与目标软件的调试操作有关的信息。

著录项

  • 公开/公告号KR101992234B1

    专利类型

  • 公开/公告日2019-06-24

    原文格式PDF

  • 申请/专利权人 삼성전자주식회사;

    申请/专利号KR20120054010

  • 发明设计人 김동근;김시영;

    申请日2012-05-22

  • 分类号G06F11/28;G06F1/04;G06F15/78;

  • 国家 KR

  • 入库时间 2022-08-21 11:48:18

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