METHOD FOR MEASURING SPACE CHARGE AND THICKNESS OR TEMPERATURE OF INSULATION LAYER

摘要

The present invention relates to a method for measuring space charge and thickness and temperature of an insulation layer and, more specifically, to a method for measuring space charge and thickness and temperature of an insulation layer, which can easily and precisely measure space charge while cable disassembly is minimized in a state in which a cable, instead of an insulation layer specimen, is actually operated. Moreover, thickness or temperature of the insulation layer can be measured, and an insulation layer material can be expected in accordance with the temperature of the insulation layer. Accordingly, a cable specimen in which the space charge is measured can be reused.;COPYRIGHT KIPO 2020