Apparatus and method for monitoring machine condition using defect evaluation

摘要

The present invention relates to a machine condition monitoring apparatus and method using a defect evaluation, the machine condition monitoring apparatus according to an embodiment of the present invention, by acquiring a defect signal from the machine of each defect state in advance and aligning the obtained defect signal A window generator generating a weighted window for each defect for extracting the representative envelope spectrum; A frequency filtering unit filtering the monitoring signal acquired from the machine to be monitored as a candidate frequency band; An envelope analyzer configured to envelop the filtered monitoring signal to generate an envelope spectrum; Defect evaluation for extracting the defect component of the machine to be monitored using the weight window for each defect and the generated envelope spectrum for each candidate frequency band, and calculates a defect evaluation index using the extracted defect component part; And an image generator which generates a defect image using the calculated defect evaluation index.