Thermographic examination device and method for the non-destructive examination of a near-surface structure on a test object

摘要

Thermographic examination device for the non-destructive examination of a near-surface structure on a test object (PO), comprising a heating device (2) for applying thermal energy to a surface area (BO) to be heated of the test object (PO); a thermal sensor device (3) for detecting a time profile (ZV) of a local temperature distribution (OTV) on a surface area (VO) of the test object (PO) to be measured, wherein the surface area (VO) to be measured is the surface area to be heated (BO) and a surface area to be measured (AO) adjacent to the surface area to be heated (BO); and an evaluation device (4) for evaluating the time profile (ZV) of the local temperature distribution (OTV) so as to detect at least one parameter (DW) of the near-surface structure at the surface area (VO) to be measured.