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Dynamic performance analysis with adjustment per storage activity
Dynamic performance analysis with adjustment per storage activity
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机译:动态性能分析,可根据存储活动进行调整
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摘要
The present invention relates to a device having a built-in self-test (BIST) circuit adapted to execute a BIST pattern in a loop mode in a memory adapted for activity factors corresponding to a programmable number of operations the BIST circuit is further configured to measure the dynamic power of a supply while the BIST pattern is being executed in the loop mode of the memory.
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