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DRAM ARCHITECTURE TO REDUCE ROW ACTIVATION CIRCUITRY POWER AND PERIPHERAL LEAKAGE AND RELATED METHODS
DRAM ARCHITECTURE TO REDUCE ROW ACTIVATION CIRCUITRY POWER AND PERIPHERAL LEAKAGE AND RELATED METHODS
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机译:减少行激活电路功率和外围泄漏的dram架构及相关方法
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摘要
A semiconductor device may include a plurality of memory cells, and at least one peripheral circuit coupled to the plurality of memory cells and comprising a superlattice. The superlattice may includea plurality of stacked groups of layers with each group of layers comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer thereon constrained within a crystal lattice of adjacent base semiconductor portions. The semiconductor device may further include a first power switching device configured to couple theat least one peripheral circuit to a first voltage supply during a first operating mode, and a second power switching device configured to couple the at least one peripheral circuit to a second voltage supply lower than the first voltage supply during a second operating mode.
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