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DRAM ARCHITECTURE TO REDUCE ROW ACTIVATION CIRCUITRY POWER AND PERIPHERAL LEAKAGE AND RELATED METHODS

机译:减少行激活电路功率和外围泄漏的dram架构及相关方法

摘要

A semiconductor device may include a plurality of memory cells, and at least one peripheral circuit coupled to the plurality of memory cells and comprising a superlattice. The superlattice may includea plurality of stacked groups of layers with each group of layers comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer thereon constrained within a crystal lattice of adjacent base semiconductor portions. The semiconductor device may further include a first power switching device configured to couple theat least one peripheral circuit to a first voltage supply during a first operating mode, and a second power switching device configured to couple the at least one peripheral circuit to a second voltage supply lower than the first voltage supply during a second operating mode.
机译:一种半导体器件可以包括多个存储单元,以及耦合到所述多个存储单元并包括超晶格的至少一个外围电路。超晶格可包括多个堆叠的层组,其中每组层包括限定基础半导体部分的多个堆叠的基础半导体单层和约束在相邻基础半导体部分的晶格内的至少一个非半导体单层。半导体器件可以进一步包括:第一功率开关器件,其被配置为在第一操作模式期间将至少一个外围电路耦合到第一电压源;以及第二功率开关器件,其被配置为将至少一个外围电路耦合到第二电压源。在第二操作模式期间低于第一电压供应。

著录项

  • 公开/公告号EP3455855B1

    专利类型

  • 公开/公告日2020-04-22

    原文格式PDF

  • 申请/专利权人 ATOMERA INCORPORATED;

    申请/专利号EP20170726749

  • 发明设计人 ROY RICHARD STEPHEN;

    申请日2017-05-11

  • 分类号G11C5/14;G11C7/22;H01L21/8238;H01L29/10;

  • 国家 EP

  • 入库时间 2022-08-21 11:41:22

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