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QUANTUM INTERFERENCE DETECTION OF OPTICAL FREQUENCY COMB OFFSET FREQUENCY

机译:光学梳齿偏移频率的量子干扰检测

摘要

A method is presented for determining an offset frequency of a frequency comb. The method includes: generating a beam of light with a waveform that repeats regularly in the time domain and exhibits a frequency comb in the frequency domain; directing the beam of light towards a point of incidence on a material; and detecting oscillation of a photocurrent in the material that is caused by the beam of light. Of note, the beam of light has an optical bandwidth that includes light propagating at a first frequency and at a second frequency, where the first frequency is less than the second frequency and the ratio of the second frequency to the first frequency is n:m, where n=m+i, m is an integer greater than one, and n and i are positive integers. Additionally, the material has a band gap and the band gap is not more than n times the first frequency.
机译:提出了一种用于确定频率梳的偏移频率的方法。该方法包括:产生具有在时域中有规律地重复并且在频域中表现出频率梳的波形的光束;以及将光束指向材料上的入射点;以及检测由光束引起的材料中的光电流的振荡。值得注意的是,光束具有的光带宽包括以第一频率和第二频率传播的光,其中第一频率小于第二频率,第二频率与第一频率之比为n:m ,其中n = m + i,m是大于1的整数,n和i是正整数。另外,材料具有带隙并且带隙不大于第一频率的n倍。

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