Sample holder for scanning probe microscope, scanning probe microscope, and Seebeck coefficient calculation method

摘要

PROBLEM TO BE SOLVED: To provide a sample holder for a scanning probe microscope and a method for calculating a Seebeck coefficient capable of obtaining local thermal properties of a measurement target. SOLUTION: A heating side support 2a having thermal conductivity for holding a heating region side of a sample 20 to be scanned by a scanning probe microscope, and a cooling side having thermal conductivity for holding a cooling region side of a sample 20. A support 2b, a heating device 4 for heating the heating side support 2a, and a cooling device 5 for cooling the cooling side support 2b are provided, and the temperature is set in a temperature transition region between the heating region side and the cooling region side. Form a gradient. [Selection diagram] Fig. 1