Burst error adding device, test signal generating device using the same, and burst error adding method

摘要

PROBLEM TO BE SOLVED: To provide a burst error adding device capable of generating a test signal for testing burst error resistance of a communication device receiving a precoded PAM4 signal, a test signal generating device using the burst error adding device, and a burst error adding method. I will provide a. SOLUTION: An error signal generator 22 for generating an error signal for adding a burst error to the MSB and LSB of a PAM4 signal in clock cycle units, and a bit of an exclusive OR operation of the MSB and LSB and the error signal. Error adding unit 23 that outputs a bit string obtained as a result of the operation, a minimum number of clock cycles necessary to realize a desired bit error rate of the test signal, and a period of the minimum number of clock cycles. And a calculator 25d for calculating the number of burst errors added to the MSB and LSB. [Selection diagram] Figure 1