机译:基于加速器测试的EDAC SRAM器件在轨软错误率外推方法
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
China Electronics Technology Group Corporation No.58 Research Institute, Wuxi, China;
China Electronics Technology Group Corporation No.58 Research Institute, Wuxi, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China;
Random access memory; Error correction; Error analysis; Sensitivity; Radiation effects; Single event upsets; Extrapolation;
机译:用于基于纳米SRAM的FPGA中诊断各种软错误的激光测试方法
机译:用于微电子设备和集成电路的灵活而强大的软错误测试系统
机译:质子诱导的单事件扰动测试和nm器件的软错误率预测
机译:使用中子辐照测试和3D混合模式器件仿真研究高级SRAM中的软错误率,包括多位翻转
机译:建模和缓解纳米级SRAM中的软错误。
机译:新的食品和药物管理局器械和放射卫生工程与物理实验室中心以及控制输液泵的测试软件方法
机译:容忍基于SRAM的FPGA中的软错误的自适应方法