首页> 外国专利> Millimeter and / or microwave imaging systems and methods including segmented inverse, enhanced resolution mode and examples of imaging devices;

Millimeter and / or microwave imaging systems and methods including segmented inverse, enhanced resolution mode and examples of imaging devices;

机译:毫米和/或微波成像系统和方法,包括分段逆,增强分辨率模式和成像设备示例;

摘要

An example of an imaging system is described herein, which may implement a microwave or millimeter wave imaging system. The described example may implement a segmented inverse technique, which constructs a measurement matrix to be used to provide multiple estimates of the reflectance values associated with the scene and inverts it. Can be converted to The processing may be partitioned according to the relative position of the antenna system and / or the particular beam width of the antenna. The examples described herein may implement an enhanced resolution mode of imaging, which may steer the beam at multiple angles for each measurement location.
机译:本文描述了成像系统的示例,其可以实现微波或毫米波成像系统。所描述的示例可以实现分段逆技术,该分段逆技术构造测量矩阵以用于提供与场景相关联的反射率值的多个估计并将其反转。可以转换为。可以根据天线系统的相对位置和/或天线的特定波束宽度对处理进行划分。本文描述的示例可以实现成像的增强分辨率模式,该模式可以针对每个测量位置以多个角度操纵光束。

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