The purpose of the present invention is to provide an elastic wave measurement and analysis method and device that make it possible to accurately locate an elastic wave source even if unexpected errors occur in some sensors from among a plurality of sensors. An elastic wave measurement and analysis method according to the present invention is a method for locating an elastic wave source by measuring and analyzing the elastic waves emitted from an object to be inspected using a plurality of sensors disposed on the surface of the object to be inspected, said method being characterized by having: a step for measuring the waveform signals of the elastic waves; a step for temporarily storing the waveform signals; a step for saving the temporarily stored waveform signals at an interval of a prescribed unit measurement time; a step for reading a temporal region including waveform signals to be used for propagation analysis; a step for determining whether a prescribed error signal is included in any of the read waveform signals; a step for creating an adjusted waveform signal from a read waveform signal determined to include the error signal by replacing the error signal portion with prescribed dummy data; a step for creating temporally inverted waveform signals by temporally inverting the adjusted waveform signal and waveform signals; and a step for carrying out backpropagation analysis on the temporally inverted waveform signals in a model of the object to be inspected.
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