Surveying equipment inspection system, equipment adjustment method using surveying equipment inspection system

摘要

To provide a measurement apparatus inspection system 100 which does not require a dedicated space, nor a space which an inspector enters between pedestals, and is compact in a size.SOLUTION: A measurement apparatus inspection system 100 has: a pedestal attachment base 110; a main pedestal 113 which is erected on the pedestal attachment base 110, and attached with an optical apparatus for use in inspection; an apparatus pedestal 115 which is erected on the pedestal attachment base 110 in a position opposing the main pedestal 113, and on which an inspected measurement apparatus 50 is placed; a first pedestal 111 which is erected on the pedestal attachment base 110, and on which a first automatic level 130a is placed; a second pedestal 112 which is erected on the pedestal attachment base 110, and on which a second automatic level 130b is placed; and an imaging unit attached to either of an eyepiece part of the optical apparatus or the inspected measurement apparatus 50, and imaging the inside of the eyepiece part. The apparatus pedestal 115 is arranged between the first pedestal 111 and the second pedestal 112.SELECTED DRAWING: Figure 1