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Error diagnosis method, error diagnosis device, and error diagnosis program

机译:错误诊断方法,错误诊断装置以及错误诊断程序

摘要

PROBLEM TO BE SOLVED: To facilitate abnormality determination and location of an abnormal place.SOLUTION: An abnormality diagnosis method includes: a first step (S11) of calculating a value for indicating a probability distribution of a regression coefficient of a regression formula where an object variable is one of measurement items and an explanation coefficient is another measurement item; a second step (S12) of calculating a value for indicating a probability distribution of a prediction value of a diagnosis item at a point of time of second measurement, based on the regression formula, a value for indicating a probability distribution of a regression coefficient calculated in the first step, and diagnosis target data; and a third step (S13) of determining abnormality in a diagnosis item based on a first degree of abnormality by calculating the first degree of abnormality as a degree of abnormality of the diagnosis item at a point of time of second measurement, based on diagnosis target data, and a value for indicating a probability distribution of a prediction value of a diagnosis item calculated in the second step.SELECTED DRAWING: Figure 5
机译:解决的问题:为了促进异常的确定和异常地点的定位。解决方案:异常诊断方法包括:第一步(S11),计算用于指示回归公式的回归系数的概率分布的值,其中对象是变量是测量项目之一,解释系数是另一个测量项目。第二步骤(S12),基于回归公式,计算用于指示在第二次测量的时间点的诊断项目的预测值的概率分布的值,该值用于指示计算出的回归系数的概率分布。第一步,诊断目标数据;第三步骤(S13),其通过基于诊断目标,通过将第一异常度计算为第二测量时的诊断项目的异常度,来基于第一异常度来确定诊断项目的异常。数据,以及用于指示在第二步中计算出的诊断项目的预测值的概率分布的值。图5

著录项

  • 公开/公告号JP6658250B2

    专利类型

  • 公开/公告日2020-03-04

    原文格式PDF

  • 申请/专利权人 株式会社IHI;

    申请/专利号JP20160084511

  • 发明设计人 鈴木 由宇;河野 幸弘;

    申请日2016-04-20

  • 分类号G01M99;G05B23/02;

  • 国家 JP

  • 入库时间 2022-08-21 11:32:04

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