Method of detecting steel sample components using multi-pulse laser induced plasma spectrum analyzer

摘要

The present invention relates to a method for detecting steel sample components by using a multi-pulse laser induced plasma spectral analysis device, and in particular, to a method for detecting steel sample components by using a multi-pulse laser induced plasma spectral analysis device that includes picosecond and nanosecond laser pulse widths. A laser induced light source is a laser light source that includes nanosecond and picosecond ultrashort pulses, and one pulse laser device can be used to generate two pulse lasers, namely, a nanosecond and a picosecond laser; the two pulse lasers pass through a same output and focusing light path, so as to ensure that the two pulse lasers are focused on a same position of a sample to be detected; a surface of the sample is irradiated by using a first beam of nanosecond laser pulse to generate plasmas; subsequently, the plasmas are irradiated by using a second beam of picosecond laser pulse to enhance spectral line emission.