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VCSEL-based resonant-cavity-enhanced atomic force microscopy active optical probe
VCSEL-based resonant-cavity-enhanced atomic force microscopy active optical probe
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机译:基于VCSEL的共振腔增强原子力显微镜有源光学探头
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摘要
A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.
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