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Systems and methods for tracking progress of design of a semiconductor device

机译:跟踪半导体器件设计进度的系统和方法

摘要

Systems and methods are provided for tracking a progress of design of a semiconductor device. In one embodiment, a method comprises receiving identification information identifying a set of tests for verification of a design under test (OUT) and generating a verification environment based on the identification information. The method further comprises generating hardware verification language coverage code corresponding to the verification environment, the hardware verification language code specifying steps for performance of the set of tests in the verification environment and generating a request for execution of the hardware verification language code. The method further comprises receiving coverage results verification information reporting results of execution of performance of the set of tests, storing the results in a database, and analyzing the results. The method also comprises identifying a verification hole, and generating a request to modify the set of tests in the verification environment, based on the verification hole. Finally, the method comprises generating a report presenting the results.
机译:提供了用于跟踪半导体器件的设计进度的系统和方法。在一个实施例中,一种方法包括:接收标识信息的标识信息,所述标识信息用于验证被测设计(OUT),并基于标识信息生成验证环境。该方法还包括:生成与验证环境相对应的硬件验证语言覆盖代码;硬件验证语言代码指定用于在验证环境中执行一组测试的步骤;以及生成用于执行硬件验证语言代码的请求。该方法还包括:接收覆盖结果验证信息,该信息报告报告该组测试的执行结果的结果;将结果存储在数据库中;以及分析结果。该方法还包括识别验证孔,并基于验证孔生成在验证环境中修改测试集的请求。最终,该方法包括生成呈现结果的报告。

著录项

  • 公开/公告号US10572115B2

    专利类型

  • 公开/公告日2020-02-25

    原文格式PDF

  • 申请/专利权人 MELLANOX TECHNOLOGIES LTD.;

    申请/专利号US201815885730

  • 发明设计人 YUVAL BORENSTEIN;AMIR LEVY;DAVID BARKAI;

    申请日2018-01-31

  • 分类号G06F17/50;G06F3/0484;

  • 国家 US

  • 入库时间 2022-08-21 11:28:31

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