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Component determination device and component determination method

机译:成分判定装置及成分判定方法

摘要

A component determination device and a component determination method for an electronic component, the component including a reference section formed as a different member to the multiple electrodes. The component determination device includes: a measuring device configured to measure positions of multiple reference points set on the reference section and a position of a measurement point set on each of the multiple electrodes; a plane calculating section configured to calculate a reference plane representing a position of the upper surface of the circuit board with respect to the component main body when the electronic component is mounted on the circuit board based on the positions of the multiple reference points; and a suitability determining section configured to determine whether the electronic component is suitable based on a distance between the reference plane and the multiple measurement points.
机译:用于电子部件的部件确定装置和部件确定方法,该部件包括形成为与多个电极不同的构件的参考部分。成分确定装置包括:测量装置,其被配置为测量设置在基准部分上的多个基准点的位置和设置在多个电极中的每个电极上的测量点的位置;平面计算部,其被配置为基于多个基准点的位置,计算表示将电子部件安装于电路基板时的电路基板的上表面相对于部件主体的位置的基准平面;合适性确定部分,其被配置为基于参考平面与多个测量点之间的距离来确定电子部件是否合适。

著录项

  • 公开/公告号US10834861B2

    专利类型

  • 公开/公告日2020-11-10

    原文格式PDF

  • 申请/专利权人 FUJI CORPORATION;

    申请/专利号US201615998952

  • 发明设计人 NOBUYUKI ISHIKAWA;KATSUNORI TANAKA;

    申请日2016-02-18

  • 分类号H05K13/08;H05K13/04;

  • 国家 US

  • 入库时间 2022-08-21 11:27:01

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