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Patterning of high density small feature size pillar structures

机译:高密度小特征尺寸支柱结构的图案化

摘要

A method for forming an array of very small pillar structures having a very small feature size that is smaller than the resolution limit of photolithographic process available for patterning such structures. The method involves forming an array of silicon pillar structures over a layer of material that will ultimately form the pillar structures. The array of silicon pillar structures is repeatedly oxidized to form a layer of silicon oxide at an outer surface of the silicon pillar structures and then etched to remove the outer layer of oxide, thereby reducing the features size (i.e. diameter) of the silicon pillar structure. A final oxidation process entirely oxidizes the remaining silicon pillar structures, leaving an array of small silicon oxide pillar structures that can be used as a mask for patterning underlying layers, including the underlying pillar material. The process is especially useful for forming an array of magnetic memory pillars.
机译:一种形成具有非常小的特征尺寸的非常小的柱状结构的阵列的方法,该非常小的特征尺寸小于可用于构图这种结构的光刻工艺的分辨率极限。该方法包括在将最终形成柱结构的材料层上形成硅柱结构的阵列。硅柱结构的阵列被重复氧化以在硅柱结构的外表面上形成一层氧化硅,然后被蚀刻以去除氧化物的外层,从而减小了硅柱结构的特征尺寸(即直径) 。最终的氧化过程会完全氧化其余的硅柱结构,从而留下一排小的氧化硅柱结构,这些阵列可用作掩模,以对包括下层柱材料在内的下层进行构图。该过程对于形成磁存储柱的阵列特别有用。

著录项

  • 公开/公告号US10614867B2

    专利类型

  • 公开/公告日2020-04-07

    原文格式PDF

  • 申请/专利权人 SPIN MEMORY INC.;

    申请/专利号US201816051272

  • 发明设计人 GIAN SHARMA;AMITAY LEVI;

    申请日2018-07-31

  • 分类号H01L29/66;G11C11/16;H01L43/10;H01L43/08;

  • 国家 US

  • 入库时间 2022-08-21 11:26:29

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