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NON-CONTACT TEST SOLUTION FOR ANTENNA-ON-PACKAGE (AOP) DEVICES USING NEAR-FIELD COUPLED RF LOOPBACK PATHS

机译:使用近场耦合RF环回路径的封装天线(AOP)设备的非接触式测试解决方案

摘要

A radio frequency (RF) loopback substrate or printed circuit board (PCB) which contains receive and transmit antennas located on the bottom of the loopback substrate which are aligned with the complementary transmit and receive antennas on an antenna on package (AOP) device under test. The loopback substrate receive and transmit antennas are coupled to each other. The device under test contacts are driven by a conventional tester, which causes RF circuitry in the integrated circuit to drive an AOP transmit antenna. The corresponding loopback substrate receive antenna receives the RF signal from the AOP transmit antenna and provides it to the loopback substrate transmit antennas. The integrated circuit package AOP receive antennas then receive the RF signals from the loopback substrate transmit antennas. The signals at the integrated circuit package AOP receive antennas are monitored through the integrated circuit contacts to monitor the received RF signals.
机译:射频(RF)回送基板或印刷电路板(PCB),其中包含位于回送基板底部的接收和发送天线,这些天线与被测封装(AOP)装置上的互补发送和接收天线对齐。回送基板接收天线和发送天线彼此耦合。被测设备的触点由常规测试仪驱动,这导致集成电路中的RF电路驱动AOP发射天线。相应的回送基板接收天线从AOP发射天线接收RF信号,并将其提供给回送基板发送天线。然后,集成电路封装AOP接收天线从回送基板发射天线接收RF信号。通过集成电路触点监视集成电路封装AOP接收天线处的信号,以监视接收到的RF信号。

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