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OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOVERY FOR A MEMORY SUB-SYSTEM

机译:内存子系统的偏移内存组件自动校准(自动)错误恢复

摘要

Several embodiments of memory devices and systems with offset memory component automatic calibration error recovery are disclosed herein. In one embodiment, a system includes at least one memory region and calibration circuitry. The memory region has memory cells that read out data states in response to application of a current read level signal. The calibration circuitry is operably coupled to the at least one memory region and is configured to determine a read level offset value corresponding to one or more of a plurality of offset read level test signals, including a base offset read level test signal. The base offset read level test signal is offset from the current read level signal by a predetermined value. The calibration circuitry is further configured to output the determined read level offset value.
机译:本文公开了具有偏移存储器组件自动校准误差恢复的存储器设备和系统的几个实施例。在一个实施例中,一种系统包括至少一个存储器区域和校准电路。该存储区域具有响应于当前读取电平信号的施加而读出数据状态的存储单元。校准电路可操作地耦合到至少一个存储器区域,并且被配置为确定与包括基本偏移读取电平测试信号的多个偏移读取电平测试信号中的一个或多个相对应的读取电平偏移值。基本偏移读取电平测试信号从当前读取电平信号偏移预定值。校准电路还被配置为输出确定的读取电平偏移值。

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