首页> 外国专利> VIRTUAL DRAIN FOR DECREASED HARMONIC GENERATION IN FULLY DEPLETED SOI (FDSOI) RF SWITCHES

VIRTUAL DRAIN FOR DECREASED HARMONIC GENERATION IN FULLY DEPLETED SOI (FDSOI) RF SWITCHES

机译:虚拟漏极,用于全耗尽SOI(FDSOI)射频开关中谐波产生的降低

摘要

The present disclosure relates to semiconductor structures and, more particularly, to virtual drains for decreased harmonic generation in fully depleted SOI (FDSOI) RF switches and methods of manufacture. The structure includes one or more active devices on a semiconductor on insulator material which is on top of a substrate; and a virtual drain region composed of a well region within the substrate and spaced apart from an active region of the one or more devices, the virtual drain region configured to be biased to collect electrons which would accumulate in the substrate.
机译:本发明涉及半导体结构,更具体地,涉及用于在完全耗尽的SOI(FDSOI)RF开关中减少谐波产生的虚拟漏极及其制造方法。该结构包括在衬底上方的绝缘体上的半导体上的一个或多个有源器件;虚拟漏区由衬底内的阱区组成,并与一个或多个器件的有源区间隔开,该虚拟漏区被配置为被偏置以收集将积聚在衬底中的电子。

著录项

  • 公开/公告号US2020020721A1

    专利类型

  • 公开/公告日2020-01-16

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES INC.;

    申请/专利号US201816031407

  • 申请日2018-07-10

  • 分类号H01L27/12;H01L29/10;H01L21/84;H01L21/762;H03K17/693;H03K17/687;

  • 国家 US

  • 入库时间 2022-08-21 11:23:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号