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RESIDUAL THERMAL STRAIN MEASUREMENT METHOD, RESIDUAL THERMAL STRAIN MEASUREMENT DEVICE, AND PROGRAM THEREFOR

机译:残余热应变测量方法,残余热应变测量装置及其程序

摘要

A residual thermal strain distribution measurement method of measuring a residual thermal strain distribution as residual thermal deformation in a sample generated under application of a thermal load, comprises recording images of a periodic pattern present on the surface of the sample by an image recording unit at a first temperature and a sample formation temperature at which the sample is formed, generating moire fringes based on each recorded image of the periodic pattern, calculating a phase of the moire fringes for the sample at the first temperature, calculating a phase of the moire fringes for the sample at the sample formation temperature, acquiring a phase difference of the moire fringes at the sample formation temperature with respect to the first temperature, and calculating a residual thermal strain of the sample at the first temperature with respect to the sample formation temperature based on the acquired phase difference.
机译:残余热应变分布测量方法,其测量残余热应变分布作为在施加热负荷下产生的样品中的残余热变形,包括通过图像记录单元在样品表面记录存在于样品表面上的周期性图案的图像。第一温度和形成样品的样品形成温度,基于周期性图案的每个记录图像生成莫尔条纹,在第一温度下计算样品的莫尔条纹的相位,计算样品的莫尔条纹的相位。在样品形成温度下的样品中,获取在样品形成温度下的莫尔条纹相对于第一温度的相位差,并基于以下公式计算在第一温度下相对于样品形成温度的样品的残余热应变:获得的相位差。

著录项

  • 公开/公告号US2020056880A1

    专利类型

  • 公开/公告日2020-02-20

    原文格式PDF

  • 申请/专利权人 NAMICS CORPORATION;

    申请/专利号US201816487349

  • 发明设计人 QINGHUA WANG;SHIEN RI;TOSHIAKI ENOMOTO;

    申请日2018-02-19

  • 分类号G01B11/16;G01B11/25;

  • 国家 US

  • 入库时间 2022-08-21 11:22:40

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