首页> 外国专利> GENE-EXPRESSION PROFILING WITH REDUCED NUMBERS OF TRANSCRIPT MEASUREMENTS

GENE-EXPRESSION PROFILING WITH REDUCED NUMBERS OF TRANSCRIPT MEASUREMENTS

机译:减少转录测量次数的基因表达谱

摘要

The present invention provides compositions and methods for making and using a transcriptome-wide gene-expression profiling platform that measures the expression levels of only a select subset of the total number of transcripts. Because gene expression is believed to be highly correlated, direct measurement of a small number (for example, 1,000) of appropriately-selected transcripts allows the expression levels of the remainder to be inferred. The present invention, therefore, has the potential to reduce the cost and increase the throughput of full-transcriptome gene-expression profiling relative to the well-known conventional approaches that require all transcripts to be measured.
机译:本发明提供了用于制备和使用全转录组基因表达谱分析平台的组合物和方法,该平台仅测量转录本总数中选定子集的表达水平。因为基因表达被认为是高度相关的,适当选择的转录物的数量少(例如,1,000)的直接测量允许其余的表达水平来进行推断。因此,相对于需要测量所有转录本的众所周知的常规方法,本发明具有降低成本和增加全转录组基因表达谱分析的产量的潜力。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号