首页> 外国专利> RESIDUAL PRESSURE MEASUREMENT SYSTEM FOR FABRY-PEROT CAVITY OF OPTICAL MEMS PRESSURE SENSOR AND METHOD THEREOF

RESIDUAL PRESSURE MEASUREMENT SYSTEM FOR FABRY-PEROT CAVITY OF OPTICAL MEMS PRESSURE SENSOR AND METHOD THEREOF

机译:光学MEMS压力传感器的法布里-珀罗腔残余压力测量系统及其方法

摘要

The present invention discloses a residual pressure measurement system for a MEMS pressure sensor with an F-P cavity and method thereof, the measurement system includes a low-coherence light source, a 3 dB coupler, a MEMS pressure sensor, an air pressure chamber, a thermostat, a pressure control system, a cavity length demodulator, an acquisition card and a computer. The measurement method comprises: performing cavity length measurement by using the reflecting light by the pressure control system at two temperatures, respectively, so as to calibrate the MEMS pressure sensor and establish a relationship between the absolute phase of a monochromatic frequency and the external pressure; performing linear fitting to the two measurement data to obtain all the external pressure when the cavity length of two measurement data are equal to each other, and substituting the theoretical equation for calculation to obtain the residual pressure under the flat condition of the diaphragm.
机译:本发明公开了一种用于具有FP腔的MEMS压力传感器的残余压力测量系统及其方法,该测量系统包括低相干光源,3dB耦合器,MEMS压力传感器,气压室,恒温器。 ,压力控制系统,腔长解调器,采集卡和计算机。该测量方法包括:通过压力控制系统分别在两个温度下利用反射光进行腔长测量,以校准MEMS压力传感器,并建立单色频率的绝对相位与外部压力之间的关系。当两个测量数据的腔长相等时,对两个测量数据进行线性拟合,得到所有的外部压力,并代入理论方程进行计算,得到膜片平坦状态下的残余压力。

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