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Method of testing a shape memory alloy element, and a validation system therefor

机译:测试形状记忆合金元件的方法及其验证系统

摘要

A method of testing a SMA element includes connecting the SMA element to a validation tool, and applying an electrical current to the SMA element over a test cycle. A resistance of the SMA element during the test cycle is measured, while the electrical current is being applied. The measured resistance of the SMA element during the test cycle is correlated to an estimated strain value of the SMA element during the test cycle. A temperature of the SMA element during the test cycle is estimated. A stress in the SMA element during the test cycle is estimated from a stress predicting grid, using the estimated strain value and the estimated temperature of the SMA element during the test cycle. The proper functionality of the SMA element may be determined based on the estimated stress in the SMA element.
机译:一种测试SMA元件的方法,包括将SMA元件连接到验证工具,以及在测试周期内向SMA元件施加电流。在施加电流的同时,在测试周期内测量SMA元件的电阻。在测试周期中测得的SMA元件的电阻与在测试周期中测得的SMA元件的应变值相关。估计测试周期中SMA元件的温度。使用估算的应变值和估算的SMA元件在测试周期内的温度,可以从应力预测网格估算SMA元件在测试周期内的应力。可以基于SMA元件中的估计应力来确定SMA元件的适当功能。

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