METHOD FOR LUMINESCENT ANALYSIS ON ATOMIC-FORCE MICROSCOPE USING FLUOROPHORE-FLUORESCENT PROBES

摘要

The invention relates to the field of technique of probe microscopy. The technical result of the supposed invention is that the used experimental technique is simplified on the one hand due to simplification of optical circuit of photon excitation and registration and the methods of classical luminescent analysis are transferred to the nanometer level on the other hand. Such transfer allows to accurately position a fluorescent probe above the test sample; consequently, it becomes possible to perform a local chemical analysis and also to study the resonance energy transfer during luminescence in interrelation with the peculiarities of the surface structure of the test sample.