METHOD FOR MEASURING STATIC LEAKAGE POWER OF CUSTOM DSP PLATFORM

摘要

pMethod for measuring static leakage power of custom DSP platform has for a novelty specific method of measuring leakage current through a few steps. The first step (100) of configuration parameters and set the parameters on the custom DSP platform, followed by a step (101) of stopping the processing unit, and the abolition of all clocking cores and other peripheral components except the processing unit. Followed by a step (102) power measurement in basic frequency clocking is f0, and then step (103) of decreasing the fundamental frequency clocking, by multiplying by a factor of (202) decrease d. After that is step (104) of power measurements at decreased frequency f clock speed, and a step (105) of calculating the static leakage current CMOS integrated circuits, as the ratio of two terms of which the first term if differential between current measured at decreased frequency (201) clock speed f multiplied by the factor (202) d, and the measured current intensity in the basic frequency (200) f0 clock speed, and the second term is a factor (202) of decrease d, decreased by 1./p