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Methods, models and systems for predicting yellow rust in wheat crops

机译:预测小麦作物黄锈病的方法,模型和系统

摘要

A method of constructing a model, preferably a Random Forest model, for predicting the presence of Yellow Rust in wheat crops, is disclosed, the method comprising the steps of: i. obtaining, for a plurality of sample wheat plots, a plurality of values for first, second and third vegetation indices V1, V2, V3, wherein the first vegetation index VI is defined by V1 = (R531+10nm _ R570+10nm) / (R531+10nm +R570+10nm), the second vegetation index V2 is defined by V2=V1* (-1) / (V4*R700+10nm /R670+10nm), wherein V4 is defined by V4 = (R800+10nm _ R670+10nm) / (R800+10nm +R670+10nm) and the third vegetation index V3 is defined by V3 = (R734+10nm _ R747+10nm) / (R715+10nm +R726+10nm), wherein Rx is the wheat canopy reflectance at the wavelength X nm, ii. obtaining, from the plurality of sample wheat plots, a plurality of Yellow Rust scores, the score for each sample wheat plot specifying the presence of Yellow Rust in that sample wheat plot, and ill. constructing or calculating a model associating the plurality of values for the vegetation indices VI, V2 and V3 with the plurality of Yellow Rust scores. Methods and systems for predicting the presence of Yellow Rust are also disclosed.
机译:公开了一种用于预测小麦作物中黄锈病的存在的模型,优选随机森林模型的构建方法,该方法包括以下步骤:i。对于多个样本小麦样地,获得第一,第二和第三植被指数V1,V2,V3的多个值,其中第一植被指数VI由V1 =(R531 + 10nm _ R570 + 10nm)/( R531 + 10nm + R570 + 10nm),第二植被指数V2由V2 = V1 *(-1)/(V4 * R700 + 10nm / R670 + 10nm)定义,其中V4由V4 =(R800 + 10nm _ R670 + 10nm)/(R800 + 10nm + R670 + 10nm),第三植被指数V3定义为V3 =(R734 + 10nm _ R747 + 10nm)/(R715 + 10nm + R726 + 10nm),其中Rx是小麦波长X nm的树冠反射率; ii。从多个样本小麦田中获得多个黄锈得分,每个样本小麦田的得分指定该小麦田中是否存在黄色锈病。建立或计算将植被指数VI,V2和V3的多个值与多个黄锈评分相关联的模型。还公开了用于预测黄锈病存在的方法和系统。

著录项

  • 公开/公告号SE542770C2

    专利类型

  • 公开/公告日2020-07-07

    原文格式PDF

  • 申请/专利权人 CHAWADE AAKASH;

    申请/专利号SE20180051472

  • 发明设计人 CHAWADE AAKASH;

    申请日2018-11-27

  • 分类号G01N21/84;G01N21;G01N21/01;

  • 国家 SE

  • 入库时间 2022-08-21 11:15:40

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