METHOD AND DEVICE FOR GENERATING A TEST PLAN, METHOD AND DEVICE FOR TESTING AN OBJECT TO BE MEASURED AND COMPUTER PROGRAM PRODUCT

摘要

The invention relates to a method and a device for generating a test plan for testing an object (2) to be measured, wherein a dataset (DS) representing the object (2) to be measured is provided, wherein a reference structure (RS1, RS2, RS3, RS4) is determined in a data-based manner, wherein the reference structure (RS1, RS2, RS3, RS4) is assigned at least one reference-structure-specific test feature, wherein, for the dataset (DS) representing the object (2) to be measured, it is tested in a data-based manner whether there are structures (S) that are similar or identical to the reference structure (RS1, RS2, RS3,RS4), wherein the reference-structure-specific test feature is assigned to each similar or identical structure (S) as a structure-specific test feature, wherein the test plan comprises the structure-specific test features determined in this way. The invention also relates to a method and a device for testing the object to be measured, and a computer program.