首页> 外国专利> LOSSLESS REAL-TIME MEASUREMENT METHOD FOR JUNCTION TEMPERATURE OF LED LIGHT SOURCE

LOSSLESS REAL-TIME MEASUREMENT METHOD FOR JUNCTION TEMPERATURE OF LED LIGHT SOURCE

机译:LED光源结温的无损实时测量方法

摘要

The present invention provides a lossless real-time measurement method for the junction temperature of an LED light source. The method comprises the following steps: S1, energizing an LED light source to be detected, and projecting, onto a screen, an optical image formed by a light beam emitted by the energized LED light source after passing through an optical element; S2, establishing a position correlation between each LED chip in the LED light source and the optical image; S3, according to the established correlation, respectively collecting a light beam at each position in the optical image, carrying out spectral analysis on light emitted by the LED chip in the light beam, and obtaining an optical frequency peak value and width information of each LED chip including a corresponding position; and S4, establishing a standard curve of a spectrum-temperature relationship, and combining the standard curve and an obtained spectrum to determine the junction temperature of each LED chip in the LED light source. By means of the present invention, the junction temperature of each LED chip can be measured in a real-time and lossless manner, and according to a measurement result, the quality and the service life of an LED light source are evaluated.
机译:本发明提供了一种用于LED光源的结温的无损实时测量方法。该方法包括以下步骤:S1,将待检测的LED光源通电,将经过通电的LED光源发出的光束通过光学元件后形成的光学图像投影到屏幕上; S2,建立LED光源中每个LED芯片与光学像之间的位置相关性; S3,根据建立的相关性,分别在光学图像中的每个位置收集光束,对光束中LED芯片发射的光进行光谱分析,得到每个LED的光频率峰值和宽度信息芯片包括相应的位置;步骤S4,建立光谱温度关系的标准曲线,并将所述标准曲线与所获得的光谱进行组合,以确定所述LED光源中各LED芯片的结温。借助于本发明,可以实时且无损地测量每个LED芯片的结温,并根据测量结果评估LED光源的质量和使用寿命。

著录项

  • 公开/公告号WO2019237414A1

    专利类型

  • 公开/公告日2019-12-19

    原文格式PDF

  • 申请/专利权人 SUZHOU JINGPIN ADVANCED MATERIALS CO. LTD.;

    申请/专利号WO2018CN92225

  • 发明设计人 GAO JU;

    申请日2018-06-21

  • 分类号G01K11;G01M11/02;

  • 国家 WO

  • 入库时间 2022-08-21 11:14:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号