NON-CONTACT PROFILOMETER AND METHOD FOR MEASURING ROUGHNESS

摘要

The invention relates to a profilometer able to measure the roughness of a surface with which it is not in contact, which comprises an emitter (2) configured to emit a beam of electromagnetic radiation onto the surface of which the roughness is to be measured, a collimator configured to homogenise the beams of electromagnetic radiation emitted by the emitter (2), thereby obtaining a set of parallel beams with the same brightness level properties, and a receiver (3) configured to receive the reflection of the beam of electromagnetic radiation emitted by the emitter (2) onto the surface of which the roughness is to be measured. These elements forming the profilometer are complemented by a processing unit configured to compare the brightness level values received by the receiver (3) with a database of brightness levels associated with the roughnesses of different materials and to select the roughness value associated with the brightness level values of the reflected beam, once the brightness level values received by the receiver (3) have been compared with the database of the processing unit.